Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue. A Test Decompression Scheme for Variable-Length Coding. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 426-431, IEEE Computer Society, 2004. [doi]
Abstract is missing.