Hideyuki Ichihara, Noboru Shimizu, Tsuyoshi Iwagaki, Tomoo Inoue. Modeling economics of LSI design and manufacturing for test design selection. In 30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012. pages 516-517, IEEE Computer Society, 2012. [doi]
@inproceedings{IchiharaSII12,
title = {Modeling economics of LSI design and manufacturing for test design selection},
author = {Hideyuki Ichihara and Noboru Shimizu and Tsuyoshi Iwagaki and Tomoo Inoue},
year = {2012},
doi = {10.1109/ICCD.2012.6378701},
url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2012.6378701},
researchr = {https://researchr.org/publication/IchiharaSII12},
cites = {0},
citedby = {0},
pages = {516-517},
booktitle = {30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-3051-0},
}