Hideyuki Ichihara, Noboru Shimizu, Tsuyoshi Iwagaki, Tomoo Inoue. Modeling economics of LSI design and manufacturing for test design selection. In 30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012. pages 516-517, IEEE Computer Society, 2012. [doi]
Abstract is missing.