Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue. Test Response Compression Based on Huffman Coding. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 446-451, IEEE Computer Society, 2003. [doi]
Abstract is missing.