A Practical Approach to Threshold Test Generation for Error Tolerant Circuits - researchr publication authors

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Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue. A Practical Approach to Threshold Test Generation for Error Tolerant Circuits. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 171-176, IEEE Computer Society, 2009. [doi]

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