Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue. A Practical Approach to Threshold Test Generation for Error Tolerant Circuits. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 171-176, IEEE Computer Society, 2009. [doi]
@inproceedings{IchiharaSYI09,
title = {A Practical Approach to Threshold Test Generation for Error Tolerant Circuits},
author = {Hideyuki Ichihara and Kenta Sutoh and Yuki Yoshikawa and Tomoo Inoue},
year = {2009},
doi = {10.1109/ATS.2009.19},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.19},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/IchiharaSYI09},
cites = {0},
citedby = {0},
pages = {171-176},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3864-8},
}