Hybrid BIST Using Partially Rotational Scan

Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara. Hybrid BIST Using Partially Rotational Scan. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 379-384, IEEE Computer Society, 2001. [doi]

Abstract

Abstract is missing.