Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita. 28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-4, IEEE, 2012. [doi]
Abstract is missing.