A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process - researchr publication authors

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Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii. A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018. pages 195-196, IEEE, 2018. [doi]

This author has not been identified. Look up 'Mitsuhiko Igarashi' in GoogleThis author has not been identified. Look up 'Yuuki Uchida' in GoogleThis author has not been identified. Look up 'Yoshio Takazawa' in GoogleThis author has not been identified. Look up 'Yasumasa Tsukamoto' in GoogleThis author has not been identified. Look up 'Koji Shibutani' in GoogleThis author has not been identified. Look up 'Koji Nii' in Google

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