Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii. A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018. pages 195-196, IEEE, 2018. [doi]
Abstract is missing.