Minoru Iida, Norio Kobayashi, Hideki Shirasu, Masayuki Nakamura. Push-on mating 57- to 81- GHz mm-Wave interface with high repeatability for ATE application. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 63-71, IEEE, 2025. [doi]
Abstract is missing.