Tetsuya Iizuka, Jaehyun Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada. All-digital on-chip monitor for PMOS and NMOS process variability measurement utilizing buffer ring with pulse counter. In 36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010. pages 182-185, IEEE, 2010. [doi]
@inproceedings{IizukaJNIA10,
title = {All-digital on-chip monitor for PMOS and NMOS process variability measurement utilizing buffer ring with pulse counter},
author = {Tetsuya Iizuka and Jaehyun Jeong and Toru Nakura and Makoto Ikeda and Kunihiro Asada},
year = {2010},
doi = {10.1109/ESSCIRC.2010.5619899},
url = {https://doi.org/10.1109/ESSCIRC.2010.5619899},
researchr = {https://researchr.org/publication/IizukaJNIA10},
cites = {0},
citedby = {0},
pages = {182-185},
booktitle = {36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010},
publisher = {IEEE},
isbn = {978-1-4244-6662-7},
}