Satoshi Ikezawa, Jun Yamamoto, Toshitsugu Ueda. Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. In 9th International Conference on Sensing Technology, ICST 2015, Auckland, New Zealand, December 8-10, 2015. pages 716-721, IEEE, 2015. [doi]
@inproceedings{IkezawaYU15,
title = {Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis},
author = {Satoshi Ikezawa and Jun Yamamoto and Toshitsugu Ueda},
year = {2015},
doi = {10.1109/ICSensT.2015.7438490},
url = {https://doi.org/10.1109/ICSensT.2015.7438490},
researchr = {https://researchr.org/publication/IkezawaYU15},
cites = {0},
citedby = {0},
pages = {716-721},
booktitle = {9th International Conference on Sensing Technology, ICST 2015, Auckland, New Zealand, December 8-10, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6314-0},
}