Satoshi Ikezawa, Jun Yamamoto, Toshitsugu Ueda. Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. In 9th International Conference on Sensing Technology, ICST 2015, Auckland, New Zealand, December 8-10, 2015. pages 716-721, IEEE, 2015. [doi]
Abstract is missing.