Toshitsugu Ueda - researchr alias

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Viewing Publication 1 - 12 from 12

2019

Endoscopic System Based on Intraoral Camera and Image ProcessingMasataka Fujimoto, Masahiro Okuda, Shinji Yoshii, Satoshi Ikezawa, Toshitsugu Ueda, Herve Tassery, Frédéric J. G. Cuisinier, Chiaki Kitamura. tbe, 66(4):1026-1033, 2019. [doi]

2017

Development of a Flow Injection Based High Frequency Dual Channel Quartz Crystal MicrobalanceJinxing Liang, Jing Zhang, Wenxiang Zhou, Toshitsugu Ueda. sensors, 17(5):1136, 2017. [doi]

Sensitivity of improvement of quartz hydrogen sensor with novel designed heaterHiroshi Oigawa, Mizuho Shimojima, Tooru Tsuno, Fusao Kohsaka, Toshitsugu Ueda. icsenst 2017: 1-4 [doi]

2015

Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysisSatoshi Ikezawa, Jun Yamamoto, Toshitsugu Ueda. icsenst 2015: 716-721 [doi]

Flip Chip Bonding of a Quartz MEMS-Based Vibrating Beam AccelerometerJinxing Liang, Liyuan Zhang, Ling Wang, Yuan Dong, Toshitsugu Ueda. sensors, 15(9):22049-22059, 2015. [doi]

2013

An Experimental Study on Fabricating an Inverted Mesa-Type Quartz Crystal Resonator Using a Cheap Wet Etching ProcessJinxing Liang, Jia Huang, Tian Zhang, Jing Zhang, Xuefeng Li, Toshitsugu Ueda. sensors, 13(9):12140-12148, 2013. [doi]

2012

Analysis of edge and corner bonded PSvfBGA reliability under thermal cycling conditions by experimental and finite element methodsHongbin Shi, F. X. Che, Cuihua Tian, Rui Zhang, Jong-Tae Park, Toshitsugu Ueda. mr, 52(9-10):1870-1875, 2012. [doi]

Thermo-mechanical reliability optimization of MEMS-based quartz resonator using validated finite element modelRui Zhang, Hongbin Shi, Yuehong Dai, Jong-Tae Park, Toshitsugu Ueda. mr, 52(9-10):2331-2335, 2012. [doi]

2011

Experiment and numerical analysis for edge and corner bonded PoP bottom package assemblies under four-point bendingHongbin Shi, Faxing Che, Toshitsugu Ueda. mr, 51(9-11):1850-1855, 2011. [doi]

Comparative studies on solder joint reliability of CTBGA assemblies with various adhesives using the array-based package shear testHongbin Shi, Toshitsugu Ueda. mr, 51(9-11):1898-1902, 2011. [doi]

2001

2000

A 1.8-V embedded 18-Mb DRAM macro with a 9-ns RAS access time and memory cell efficiency of 33%Yuji Yokoyama, Nybutaka Itoh, Masap Katayama, Kazumasa Takashima, Hiroshi Akasaki, Masayuki Kaneda, Toshitsugu Ueda, Yousuke Tanaka, Eiji Yamasaki, Masaya Todokoro, Keinosuke Toriyama, Hiroshi Miki, Masayoshi Yagyu, Tom Kobayashi, Syuichi Miyaoka, Nobuo Tamba. cicc 2000: 279-282 [doi]

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