Comparative studies on solder joint reliability of CTBGA assemblies with various adhesives using the array-based package shear test

Hongbin Shi, Toshitsugu Ueda. Comparative studies on solder joint reliability of CTBGA assemblies with various adhesives using the array-based package shear test. Microelectronics Reliability, 51(9-11):1898-1902, 2011. [doi]

Abstract

Abstract is missing.