Sangsoon Im, Giha Nam, Sungcheol Park, Mijung Noh. Advanced safety test solution for automotive SoC based on In-System-Test architecture. In IEEE International Symposium on Circuits and Systems, ISCAS 2022, Austin, TX, USA, May 27 - June 1, 2022. pages 2290-2293, IEEE, 2022. [doi]
@inproceedings{ImNPN22,
title = {Advanced safety test solution for automotive SoC based on In-System-Test architecture},
author = {Sangsoon Im and Giha Nam and Sungcheol Park and Mijung Noh},
year = {2022},
doi = {10.1109/ISCAS48785.2022.9937235},
url = {https://doi.org/10.1109/ISCAS48785.2022.9937235},
researchr = {https://researchr.org/publication/ImNPN22},
cites = {0},
citedby = {0},
pages = {2290-2293},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2022, Austin, TX, USA, May 27 - June 1, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8485-5},
}