Sangsoon Im, Giha Nam, Sungcheol Park, Mijung Noh. Advanced safety test solution for automotive SoC based on In-System-Test architecture. In IEEE International Symposium on Circuits and Systems, ISCAS 2022, Austin, TX, USA, May 27 - June 1, 2022. pages 2290-2293, IEEE, 2022. [doi]
Abstract is missing.