High-speed DFG-level SEU vulnerability analysis for applying selective TMR to resource-constrained CGRA

Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato. High-speed DFG-level SEU vulnerability analysis for applying selective TMR to resource-constrained CGRA. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 538-545, IEEE, 2013. [doi]

Authors

Takashi Imagawa

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Hiroshi Tsutsui

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Hiroyuki Ochi

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Takashi Sato

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