High-speed DFG-level SEU vulnerability analysis for applying selective TMR to resource-constrained CGRA

Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato. High-speed DFG-level SEU vulnerability analysis for applying selective TMR to resource-constrained CGRA. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 538-545, IEEE, 2013. [doi]

Abstract

Abstract is missing.