Fine-Grain Leakage Power Reduction Method for m-out-of-n Encoded Circuits Using Multi-threshold-Voltage Transistors

Masashi Imai, Kouei Takada, Takashi Nanya. Fine-Grain Leakage Power Reduction Method for m-out-of-n Encoded Circuits Using Multi-threshold-Voltage Transistors. In 15th IEEE Symposium on Asynchronous Circuits and Systems, ASYNC 2009, Chapel Hill, NC, USA, May 17-20, 2009. pages 209-216, IEEE Computer Society, 2009. [doi]

Abstract

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