Michael E. Imhof, Hans-Joachim Wunderlich. Bit-Flipping Scan - A unified architecture for fault tolerance and offline test. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{ImhofW14,
title = {Bit-Flipping Scan - A unified architecture for fault tolerance and offline test},
author = {Michael E. Imhof and Hans-Joachim Wunderlich},
year = {2014},
doi = {10.7873/DATE2014.206},
url = {http://dx.doi.org/10.7873/DATE2014.206},
researchr = {https://researchr.org/publication/ImhofW14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014},
publisher = {IEEE},
}