Shinkichi Inagaki, Tatsuya Suzuki, Mitsuo Saito, Takeshi Aoki. Local/global fault diagnosis of event-driven controlled systems based on probabilistic inference. In 46th IEEE Conference on Decision and Control, CDC 2007, New Orleans, LA, USA, December 12-14, 2007. pages 2633-2638, IEEE, 2007. [doi]
@inproceedings{InagakiSSA07,
title = {Local/global fault diagnosis of event-driven controlled systems based on probabilistic inference},
author = {Shinkichi Inagaki and Tatsuya Suzuki and Mitsuo Saito and Takeshi Aoki},
year = {2007},
doi = {10.1109/CDC.2007.4434263},
url = {http://dx.doi.org/10.1109/CDC.2007.4434263},
researchr = {https://researchr.org/publication/InagakiSSA07},
cites = {0},
citedby = {0},
pages = {2633-2638},
booktitle = {46th IEEE Conference on Decision and Control, CDC 2007, New Orleans, LA, USA, December 12-14, 2007},
publisher = {IEEE},
}