Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection - researchr publication authors

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Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev. Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]

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