Automated testing of Medium Voltage Drive Hardware in Loop systems

Aravind Ingalalli, Nitin Adlok, Shanthibhushan B, Shriram S. Automated testing of Medium Voltage Drive Hardware in Loop systems. In 20th IEEE Conference on Emerging Technologies & Factory Automation, ETFA 2015, Luxembourg, September 8-11, 2015. pages 1-5, IEEE, 2015. [doi]

Abstract

Abstract is missing.