Michiko Inoue, Chikateru Jinno, Hideo Fujiwara. An Extended Class of Sequential Circuits with Combinational Test Generation Complexity. In 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings. pages 200-205, IEEE Computer Society, 2002. [doi]
Abstract is missing.