Test pattern selection to optimize delay test quality with a limited size of test set - researchr publication authors

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Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara. Test pattern selection to optimize delay test quality with a limited size of test set. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 260, IEEE Computer Society, 2010. [doi]

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