Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara. Test pattern selection to optimize delay test quality with a limited size of test set. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 260, IEEE Computer Society, 2010. [doi]
Abstract is missing.