Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara. Test pattern selection to optimize delay test quality with a limited size of test set. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 260, IEEE Computer Society, 2010. [doi]
@inproceedings{InoueTYIF10,
title = {Test pattern selection to optimize delay test quality with a limited size of test set},
author = {Michiko Inoue and Akira Taketani and Tomokazu Yoneda and Hiroshi Iwata and Hideo Fujiwara},
year = {2010},
doi = {10.1109/ETSYM.2010.5512733},
url = {http://dx.doi.org/10.1109/ETSYM.2010.5512733},
tags = {optimization, testing},
researchr = {https://researchr.org/publication/InoueTYIF10},
cites = {0},
citedby = {0},
pages = {260},
booktitle = {15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-5833-2},
}