Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, P. Scaramuzza, Rudolf Ullmann. Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.