Dimitris P. Ioannou, Adam W. DiVergilio. High Temperature Annealing induced recovery of Hot-Carrier degradation in High Performance NPN SiGe HBTs. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2024, Fort Lauderdale, FL, USA, October 27-30, 2024. pages 270-273, IEEE, 2024. [doi]
Abstract is missing.