Dimitris P. Ioannou, Y. Tan, R. Logan, K. Bandy, R. Achanta, P. C. Wang, D. Brochu, M. Jaffe. Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 2-1, IEEE, 2018. [doi]
Abstract is missing.