Masahiro Ishida, Dong Sam Ha, Takahiro J. Yamaguchi. COMPACT: A Hybrid Method for Compressing Test Data. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 62-69, IEEE Computer Society, 1998. [doi]
@inproceedings{IshidaHY98,
title = {COMPACT: A Hybrid Method for Compressing Test Data},
author = {Masahiro Ishida and Dong Sam Ha and Takahiro J. Yamaguchi},
year = {1998},
url = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360062.pdf},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/IshidaHY98},
cites = {0},
citedby = {0},
pages = {62-69},
booktitle = {16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8436-4},
}