Masahiro Ishida, Dong Sam Ha, Takahiro J. Yamaguchi. COMPACT: A Hybrid Method for Compressing Test Data. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 62-69, IEEE Computer Society, 1998. [doi]
No references recorded for this publication.
No citations of this publication recorded.