Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri Fiez, Mike Peng Li. Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]
@inproceedings{IshidaYSFL14,
title = {Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test},
author = {Masahiro Ishida and Takahiro J. Yamaguchi and Mani Soma and Terri Fiez and Mike Peng Li},
year = {2014},
doi = {10.1109/VTS.2014.6818781},
url = {http://dx.doi.org/10.1109/VTS.2014.6818781},
researchr = {https://researchr.org/publication/IshidaYSFL14},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014},
publisher = {IEEE},
}