Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki. A Design for Testability Method for k-Cycle Capture Test Generation. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 40-43, IEEE, 2019. [doi]
Abstract is missing.