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Influence of charged samples on imaging in scanning ion conductance microscopy

Kimihiro Ishizaki, Tatsuo Ushiki, Masato Nakajima, Futoshi Iwata. Influence of charged samples on imaging in scanning ion conductance microscopy. In International Symposium on Micro-NanoMechatronics and Human Science, MHS 2013, Nagoya, Japan, November 10-13, 2013. pages 1-4, IEEE, 2013. [doi]

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Kimihiro Ishizaki

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Tatsuo Ushiki

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Masato Nakajima

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Futoshi Iwata

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