Kimihiro Ishizaki, Tatsuo Ushiki, Masato Nakajima, Futoshi Iwata. Influence of charged samples on imaging in scanning ion conductance microscopy. In International Symposium on Micro-NanoMechatronics and Human Science, MHS 2013, Nagoya, Japan, November 10-13, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{IshizakiUNI13,
title = {Influence of charged samples on imaging in scanning ion conductance microscopy},
author = {Kimihiro Ishizaki and Tatsuo Ushiki and Masato Nakajima and Futoshi Iwata},
year = {2013},
doi = {10.1109/MHS.2013.6710400},
url = {http://dx.doi.org/10.1109/MHS.2013.6710400},
researchr = {https://researchr.org/publication/IshizakiUNI13},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {International Symposium on Micro-NanoMechatronics and Human Science, MHS 2013, Nagoya, Japan, November 10-13, 2013},
publisher = {IEEE},
isbn = {978-1-4799-1527-9},
}