Modeling Residual Life of an IC Considering Multiple Aging Mechanisms

Md. Nazmul Islam, Sandip Kundu. Modeling Residual Life of an IC Considering Multiple Aging Mechanisms. In 25th IEEE North Atlantic Test Workshop, NATW 2016, Providence, RI, USA, May 9-11, 2016. pages 24-27, IEEE, 2016. [doi]

Abstract

Abstract is missing.