On IC traceability via blockchain

Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu. On IC traceability via blockchain. In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-4, IEEE, 2018. [doi]

Authors

Md. Nazmul Islam

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Vinay C. Patil

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Sandip Kundu

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