Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu. On IC traceability via blockchain. In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-4, IEEE, 2018. [doi]
@inproceedings{IslamPK18-0,
title = {On IC traceability via blockchain},
author = {Md. Nazmul Islam and Vinay C. Patil and Sandip Kundu},
year = {2018},
doi = {10.1109/VLSI-DAT.2018.8373269},
url = {https://doi.org/10.1109/VLSI-DAT.2018.8373269},
researchr = {https://researchr.org/publication/IslamPK18-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4260-3},
}