Noriyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita. An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 22, IEEE Computer Society, 1997. [doi]
Abstract is missing.