Kyosuke Ito, Takashi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera. Modeling of Random Telegraph Noise under circuit operation - Simulation and measurement of RTN-induced delay fluctuation. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 22-27, IEEE, 2011. [doi]
Abstract is missing.