Cantilever Type Probe Card for At-Speed Memory Test on Wafer - researchr publication

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Hitoshi Iwai, Atsushi Nakayama, Naoko Itoga, Kotaro Omata. Cantilever Type Probe Card for At-Speed Memory Test on Wafer. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 85-89, IEEE Computer Society, 2005. [doi]

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