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Studies of the quality of GdSiO-Si interface

Marcin Iwanowicz, Jakub Jasinski, Grzegorz Gluszko, Lidia Lukasiak, Andrzej Jakubowski, Heinrich Gottlob, Mathias Schmidt. Studies of the quality of GdSiO-Si interface. Microelectronics Reliability, 51(7):1178-1182, 2011. [doi]

Authors

Marcin Iwanowicz

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Jakub Jasinski

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Grzegorz Gluszko

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Lidia Lukasiak

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Andrzej Jakubowski

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Heinrich Gottlob

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Mathias Schmidt

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