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Marcin Iwanowicz, Jakub Jasinski, Grzegorz Gluszko, Lidia Lukasiak, Andrzej Jakubowski, Heinrich Gottlob, Mathias Schmidt. Studies of the quality of GdSiO-Si interface. Microelectronics Reliability, 51(7):1178-1182, 2011. [doi]
Abstract is missing.