Marcin Iwanowicz, Jakub Jasinski, Grzegorz Gluszko, Lidia Lukasiak, Andrzej Jakubowski, Heinrich Gottlob, Mathias Schmidt. Studies of the quality of GdSiO-Si interface. Microelectronics Reliability, 51(7):1178-1182, 2011. [doi]
@article{IwanowiczJGLJGS11,
title = {Studies of the quality of GdSiO-Si interface},
author = {Marcin Iwanowicz and Jakub Jasinski and Grzegorz Gluszko and Lidia Lukasiak and Andrzej Jakubowski and Heinrich Gottlob and Mathias Schmidt},
year = {2011},
doi = {10.1016/j.microrel.2011.03.006},
url = {http://dx.doi.org/10.1016/j.microrel.2011.03.006},
researchr = {https://researchr.org/publication/IwanowiczJGLJGS11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {7},
pages = {1178-1182},
}