Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi 0001, Kazumi Hatayama. Innovative Test Practices in Asia. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1, IEEE, 2020. [doi]
Abstract is missing.