Hiroyuki Iwata, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara. A DFT Method for RTL Data Paths Based on Partially Strong Testability to Guarantee Complete Fault Efficiency. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 306-311, IEEE Computer Society, 2005. [doi]
Abstract is missing.