Defect-Oriented Test for Ultra-Low DPM

Vikram Iyengar, Phil Nigh. Defect-Oriented Test for Ultra-Low DPM. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 455, IEEE Computer Society, 2005. [doi]

Authors

Vikram Iyengar

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Phil Nigh

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